Naslov (eng)

Radiation Damage in Electronic Memory Devices

Autor

Vujisić, Miloš
Fetahović, Irfan S.
Pejović, Milić

Opis (eng)

Abstract: This paper investigates the behavior of semiconductor memories exposed to radiation in order to establish their applicability in a radiation environment.The experimental procedure has been used to test radiation hardness of commercial semiconductor memories. Different types of memory chips have been exposed to indirect ionizing radiation by changing radiation dose intensity.The effect of direct ionizing radiation on semiconductor memory behavior has been analyzed by using Monte Carlo simulation method. Obtained results show that gamma radiation causes decrease in threshold voltage, being proportional to the absorbed dose of radiation. Monte Carlo simulations of radiation interaction with material proved to be significant and can be a good estimation tool in probing semiconductor memory behavior in radiation environment.

Jezik

engleski

Datum

2013

Licenca

Ovo delo je licencirano pod uslovima licence
Creative Commons CC BY 4.0 - Creative Commons Autorstvo 4.0 International License.

http://creativecommons.org/licenses/by/4.0/legalcode

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